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NP0640SBMCT3G 데이터시트(HTML) 2 Page - ON Semiconductor

부품명 NP0640SBMCT3G
상세내용  80A, Ultra Low Capacitance TSPD
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제조사  ONSEMI [ON Semiconductor]
홈페이지  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

NP0640SBMCT3G 데이터시트(HTML) 2 Page - ON Semiconductor

  NP0640SBMCT3G 데이터시트 HTML 1Page - ON Semiconductor NP0640SBMCT3G 데이터시트 HTML 2Page - ON Semiconductor NP0640SBMCT3G 데이터시트 HTML 3Page - ON Semiconductor NP0640SBMCT3G 데이터시트 HTML 4Page - ON Semiconductor NP0640SBMCT3G 데이터시트 HTML 5Page - ON Semiconductor NP0640SBMCT3G 데이터시트 HTML 6Page - ON Semiconductor NP0640SBMCT3G 데이터시트 HTML 7Page - ON Semiconductor  
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NP−SBMC Series
http://onsemi.com
2
SURGE RATINGS
IPPS
A
ITSM
A
di/dt
Waveform (ms)
2x10
8x20
10x160
10x560
10x360
10x1000
5x310
0.1 s
60 Hz
A/ms
Value
250
250
150
100
125
80
100
30
500
MAXIMUM RATINGS (TA = 25°C unless otherwise noted)
Symbol
Rating
Value
Unit
VDRM
Repetitive peak off−state voltage: Rated maximum
(peak) continuous voltage that may be applied in the
off−state conditions including all dc and repetitive
alternating voltage components.
NP0640SBMCT3G
$58
V
NP0720SBMCT3G
$65
NP0900SBMCT3G
$75
NP1100SBMCT3G
$90
NP1300SBMCT3G
$120
NP1500SBMCT3G
$140
NP1800SBMCT3G
$170
NP2100SBMCT3G
$180
NP2300SBMCT3G
$190
NP2600SBMCT3G
$220
NP3100SBMCT3G
$275
NP3500SBMCT3G
$320
IPPS
Nonrepetitive peak pulse current: Rated maximum
value of peak impulse pulse current that may be
applied.
2x10 ms, GR−1089−CORE
250
A
8x20 ms, IEC−61000−4−5
250
10x160 ms, TIA−968−A
150
10x560 ms, TIA−968−A
100
10x360 ms, GR−1089−CORE
125
10x1000 ms, GR−1089−CORE
80
5x310 ms, ITU−K.20/K.21/K.45
100
ITSM
Nonrepetitive peak on−state current: Rated
maximum (peak) value of ac power frequency
on−state surge current which may be applied for a
specified time or number of ac cycles.
0.1s, 50/60 Hz, full sine wave
30
A
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.


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