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DAC1008D750HN 데이터시트(PDF) 8 Page - NXP Semiconductors |
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DAC1008D750HN 데이터시트(HTML) 8 Page - NXP Semiconductors |
8 / 99 page DAC1008D750_1 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Objective data sheet Rev. 01 — 4 October 2010 8 of 99 NXP Semiconductors DAC1008D750 2 ×, 4× or 8× interpolating with JESD204A Vidth input differential threshold voltage |V gpd| < 50 mV [4] C −100 - +100 mV Ri input resistance D - 10 - M Ω CI input capacitance D - 0.5 - pF Digital inputs (SDO, SDIO, SCLK, SCS_N, RESET_N) VIL LOW-level input voltage CGND - 0.54 V VIH HIGH-level input voltage C1.26 - VDDD V IIL LOW-level input current VIL =0.54V I - 1 - μA IIH HIGH-level input current VIH =1.26V I - 1 - μA Digital inputs (Vin_p/Vin_n)[5] VI(cm) common-mode input voltage D 0.68 0.78 1.40 V VI(dif)(p-p) peak-to-peak differential input voltage D 175 - 1000 mV Ztt Vtt source impedance D - 0.7 - Ω ΔZ i differential input impedance D - 100 - Ω Digital outputs (SYNC_OUTN/SYNC_OUTP)[6] Vo(cm) common-mode output voltage I 0.79 1.17 1.46 V Vo(dif)(p-p) peak-to-peak differential output voltage I 0.12 0.48 0.96 V Digital inputs/outputs (MDS_N/MDS_P) Vo(dif)(p-p) peak-to-peak differential output voltage D - 600 - mV Co(L) Output load capacitance between pins GND and MDS_N or MDS_P D- - 10 pF CI Input capacitance between pins GND and MDS_N or MDS_P D - 0.3 - pF Analog outputs (IOUTAP, IOUTAN, IOUTBP, IOUTBN) IO(fs) full-scale output current register value = 00h (see Table 14 and Table 15) D- 1.6 - mA register = default value (see Table 14 and Table 15) -20 - mA VO output voltage compliance range D 1.8 - VDDA(3V3) V Ro output resistance D - 250 - k Ω Table 5. Characteristics …continued VDDA(1V8) =VDDD = 1.7 V to 1.9 V; VDDA(3V3) = 3.0 V to 3.6 V; AGND and GND are shorted together; Tamb = −40 °C to +85 °C; typical values measured at VDDA(1V8) =VDDD =1.8 V; VDDA(3V3) =3.3 V; Tamb =+25 °C; RL =50 Ω; IO(fs) = 20 mA; maximum sample rate; PLL off unless otherwise specified. Symbol Parameter Conditions Test[1] Min Typ Max Unit |
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