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STK14C88-3NF35 데이터시트(PDF) 9 Page - Cypress Semiconductor |
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STK14C88-3NF35 데이터시트(HTML) 9 Page - Cypress Semiconductor |
9 / 18 page STK14C88-3 Document Number: 001-50592 Rev. *D Page 9 of 18 Data Retention and Endurance Parameter Description Min Unit DATAR Data Retention 100 Years NVC Nonvolatile STORE Operations 1,000 K Capacitance In the following table, the capacitance parameters are listed.[8] Parameter Description Test Conditions Max Unit CIN Input Capacitance TA = 25°C, f = 1 MHz, VCC = 0 to 3.0 V 5 pF COUT Output Capacitance 7 pF Thermal Resistance In the following table, the thermal resistance parameters are listed.[8] Parameter Description Test Conditions 32-SOIC 32-PDIP Unit Θ JA Thermal Resistance (Junction to Ambient) Test conditions follow standard test methods and procedures for measuring thermal impedance, per EIA / JESD51. TBD TBD °C/W Θ JC Thermal Resistance (Junction to Case) TBD TBD °C/W Figure 6. AC Test Loads AC Test Conditions 3.3V Output 30 pF R1 317 Ω R2 351 Ω Input Pulse Levels ..................................................0 V to 3 V Input Rise and Fall Times (10% - 90%)........................ <5 ns Input and Output Timing Reference Levels ................... 1.5 V Note 8. These parameters are guaranteed by design and are not tested. [+] Feedback [+] Feedback |
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