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TSC2046EQPWRQ1 데이터시트(PDF) 3 Page - Texas Instruments |
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TSC2046EQPWRQ1 데이터시트(HTML) 3 Page - Texas Instruments |
3 / 28 page TSC2046E-Q1 www.ti.com SBAS510 – JUNE 2010 ABSOLUTE MAXIMUM RATINGS (1) (2) over operating free-air temperature range (unless otherwise noted) VCC Supply voltage range +VCC, IOVDD -0.3 V to 6 V Digital inputs -0.3 V to +VCC + 0.3 V VI Input voltage range Analog inputs -0.3 V to +VCC + 0.3 V PD Power dissipation 250 mW qJA Package thermal impedance, junction to free air 108.4°C TA Operating free-air temperature range -40°C to 125°C TJ Maximum junction temperature 150°C Tstg Storage temperature range -65°C to 150°C IEC Contact Discharge(3) X+, X-, Y+, Y- ±15kV (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) All voltages are referenced to GND. (3) Test method based on IEC Std 61000-4-2. Contact Texas Instruments for test details. ELECTRICAL CHARACTERISTICS TA = -40°C to 125°C, +VCC = 2.7V, VREF = 2.5V internal voltage, fSAMPLE = 125kHz, fCLK = 16 × fSAMPLE = 2MHz, 12-bit mode, digital inputs = GND or IOVDD, +VCC ≥ IOVDD (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Analog Input VI Full-scale input voltage span Positive Input-Negative Input 0 VREF V Positive Input -0.2 +VCC + 0.2 VI Absolute input voltage V Negative Input -0.2 +0.2 Ci Capacitance 25 pF Ileak Leakage current 0.1 µA System Performance Resolution 12 bits No missing codes 11 bits Integral linearity error ±2 LSB(1) Offset error ±6 LSB Gain error External VREF ±4 LSB Vn Noise Including internal VREF, RMS 70 µV PSRR Power-supply rejection ratio 70 dB Sampling Dynamics CLK Conversion time 12 cycles CLK Acquisition time 3 cycles Throughput rate 125 kHz Multiplexer settling time 500 ns Aperture delay 30 ns Aperture jitter 100 ns Channel-to-channel isolation VIN = 2.5 Vpp at 50 kHz 100 dB Switch Drivers Y+, X+ on-resistance 5 Ω Y-, X- on-resistance 6 Ω Drive current(2) Duration 100 ms 50 mA (1) LSB = least significant bit. With VREF equal to 2.5 V, one LSB is 610 µV. (2) Specified by design. Exceeding 50-mA source current may result in device degradation. Copyright © 2010, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Link(s): TSC2046E-Q1 |
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