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SN74BCT8373DW 데이터시트(PDF) 5 Page - Texas Instruments |
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SN74BCT8373DW 데이터시트(HTML) 5 Page - Texas Instruments |
5 / 21 page SN74BCT8373 SCAN TEST DEVICE WITH OCTAL DTYPE LATCHES SCBS471 − JUNE 1990 − REVISED JUNE 1994 2−5 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251−1443 test architecture Serial-test information is conveyed by means of a 4-wire test bus, or TAP, that conforms to IEEE Standard 1149.1-1990. Test instructions, test data, and test control signals all are passed along this serial-test bus. The TAP controller monitors two signals from the test bus, namely TCK and TMS. The TAP controller extracts the synchronization (TCK) and state control (TMS) signals from the test bus and generates the appropriate on-chip control signals for the test structures in the device. Figure 1 shows the TAP-controller state diagram. The TAP controller is fully synchronous to the TCK signal. Input data is captured on the rising edge of TCK, and output data changes on the falling edge of TCK. This scheme ensures that data to be captured is valid for fully one-half of the TCK cycle. The functional block diagram illustrates the IEEE Standard 1149.1-1990 4-wire test bus and boundary-scan architecture and the relationship among the test bus, the TAP controller, and the test registers. As illustrated, the device contains an 8-bit instruction register and three test-data registers: an 18-bit boundary-scan register, a 2-bit boundary-control register, and a 1-bit bypass register. Test-Logic-Reset Run-Test/Idle Select-DR-Scan Capture-DR Shift-DR Exit1-DR Pause-DR Update-DR TMS = L TMS = L TMS = H TMS = L TMS = H TMS = H TMS = L TMS = H TMS = L TMS = L TMS = H TMS = L Exit2-DR Select-IR-Scan Capture-IR Shift-IR Exit1-IR Pause-IR Update-IR TMS = L TMS = L TMS = H TMS = L TMS = H TMS = H TMS = L TMS = H TMS = L Exit2-IR TMS = L TMS = H TMS = H TMS = H TMS = L TMS = H TMS = L TMS = H TMS = H TMS = H TMS = L Figure 1. TAP-Controller State Diagram |
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