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SN74BCT8373DWR 데이터시트(PDF) 7 Page - Texas Instruments

부품명 SN74BCT8373DWR
상세설명  SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES
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SN74BCT8373DWR 데이터시트(HTML) 7 Page - Texas Instruments

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SN74BCT8373
SCAN TEST DEVICE
WITH OCTAL DTYPE LATCHES
SCBS471 − JUNE 1990 − REVISED JUNE 1994
2−7
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
POST OFFICE BOX 1443
HOUSTON, TEXAS 77251−1443
Shift-DR
While in the stable Shift-DR state, data is serially shifted through the selected data register on each TCK cycle.
The first shift occurs on the first rising edge of TCK after entry to the Shift-DR state (i.e., no shifting occurs during
the TCK cycle in which the TAP controller changes from Capture-DR to Shift-DR or from Exit2-DR to Shift-DR).
The last shift occurs on the rising edge of TCK upon which the TAP controller exits the Shift-DR state.
Exit1-DR, Exit2-DR
The Exit1-DR and Exit2-DR states are temporary states that end a data-register scan. It is possible to return
to the Shift-DR state from either Exit1-DR or Exit2-DR without recapturing the data register.
Pause-DR
No specific function is performed in the stable Pause-DR state, in which the TAP controller can remain
indefinitely. The Pause-DR state suspends and resumes data-register scan operations without loss of data.
Update-DR
If the current instruction calls for the selected data register to be updated with current data, then such update
occurs on the falling edge of TCK following entry to the Update-DR state, at which time TDO also goes from the
active state to the high-impedance state.
Capture-IR
In the Capture-IR state, the instruction register captures its current status value. This capture operation occurs
on the rising edge of TCK upon which the TAP controller exits the Capture-IR state.
Upon entry to the Capture-IR state, the instruction register is placed in the scan path between TDI and TDO and,
on the first falling edge of TCK, TDO goes from the high-impedance state to an active state. If the TAP controller
has not passed through the Test-Logic-Reset state since the last scan operation, TDO will enable to the level
present when it was last disabled. If the TAP controller has passed through the Test-Logic-Reset state since the
last scan operation, TDO will enable to a low level.
For the SN74BCT8373, the status value loaded in the Capture-IR state is the fixed binary value 10000001.
Shift-IR
While in the stable Shift-IR state, instruction data is serially shifted through the instruction register on each TCK
cycle. The first shift occurs on the first rising edge of TCK after entry to the Shift-IR state (i.e., no shifting occurs
during the TCK cycle in which the TAP controller changes from Capture-IR to Shift-IR or from Exit2-IR to
Shift-IR). The last shift occurs on the rising edge of TCK upon which the TAP controller exits the Shift-IR state.
Exit1-IR, Exit2-IR
The Exit1-IR and Exit2-IR states are temporary states that end an instruction-register scan. It is possible to
return to the Shift-IR state from either Exit1-IR or Exit2-IR without recapturing the instruction register.
Pause-IR
No specific function is performed in the stable Pause-IR state, in which the TAP controller can remain indefinitely.
The Pause-IR state suspends and resumes instruction-register scan operations without loss of data.
Update-IR
The current instruction is updated and takes effect on the falling edge of TCK following entry to the Update-IR
state, at which time TDO also goes from the active state to the high-impedance state.


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