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CXA3026Q 데이터시트(PDF) 9 Page - Sony Corporation |
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CXA3026Q 데이터시트(HTML) 9 Page - Sony Corporation |
9 / 30 page – 9 – CXA3026Q Electrical Characteristics Measurement Circuit Current Consumption Measurement Circuit VRT VIN VRB AVCC DVCC1 DVCC2 DGND3 DGND2 DGND1 AGND CLK/E DVEE3 5MHz PECL 4V 1.95V 2V 5V 5V Icc IEE Integral Linearity Error Measurement Circuit Differential Linearity Error Measurement Circuit CXA3026Q A < B A > B Comparator A8 to A1 A0 B8 to B1 B0 Buffer Controller DVM 8 8 “1” “0” 000···00 to 111···10 VIN +V –V S2 S1 S1: ON when A < B S2: ON when A > B Sampling Delay Measurement Circuit Aperture Jitter Measurement Circuit CXA3026Q OSC1 φ: Variable OSC2 Logic Analizer 100MHz 100MHz Amp ECL Buffer CLK VIN 8 fr 1024 samples Aperture Jitter Measurement Method VIN CLK VIN CLK VRT VRM2 VRB 129 128 127 126 125 Sampling timing fluctuation (= aperture jitter) σ (LSB) ∆υ ∆ t Error Rate Measurement Circuit Comparator A > B Pulse Counter CXA3026Q Signal Source Latch Latch 1/8 + Signal Source Fc 4 –1kHz 2Vp-p Sin Wave Fc VIN CLK CLK 8 16LSB A B Where σ (LSB) is the deviation of the output codes when the largest slew rate point is sampled at the clock which has exactly the same frequency as the analog input signal, the aperture jitter Taj is: Taj = σ/ = σ/ ( ) ∆t ∆υ 2 256 × 2πf |
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