PLCC

3

2

1

20

19

9

10

11

12

13

18

17

16

15

14

4

5

6

7

8

TOP VIEW

(Not to Scale)

PIN 1

IDENTIFIER

DGND

DAC A/DAC B

(MSB) DB7

DB6

WR

CS

DB0 (LSB)

AD7528

Parameter

Version

1

°CT

°CT

Units

Test Conditions/Comments

CHANNEL-TO-CHANNEL ISOLATION

Both DAC Latches Loaded with 11111111.

All

–77

–77

dB typ

–77

–77

dB typ

DIGITAL CROSSTALK

All

30

60

nV sec typ

Measured for Code Transition 00000000 to

11111111

HARMONIC DISTORTlON

All

–85

–85

dB typ

NOTES

°C to +85°C

A, B, C Versions: –40

°C to +85°C

S, T, U Versions: –55

°C to +125°C

°C) is less than 1 nA.

(suffix D) to DGND.

Specifications subject to change without notice.

both DACs is adjustable to zero with external resistance.

Output Capacitance

Capacitance from OUT A or OUT B to AGND.

Digital to Analog Glitch lmpulse

The amount of charge injected from the digital inputs to the

analog output when the inputs change state. This is normally

specified as the area of the glitch in either pA-secs or nV-secs

depending upon whether the glitch is measured as a current or

Propagation Delay

This is a measure of the internal delays of the circuit and is

defined as the time from a digital input change to the analog

output current reaching 90% of its final value.

Channel-to-Channel Isolation

The proportion of input signal from one DAC’s reference input

which appears at the output of the other DAC, expressed as a

ratio in dB.

Digital Crosstalk

The glitch energy transferred to the output of one converter due

to a change in digital input code to the other converter. Speci-

fied in nV secs.

PIN CONFIGURATIONS

ABSOLUTE MAXIMUM RATINGS

°C unless otherwise noted)

±25 V

±25 V

Power Dissipation (Any Package) to +75

°C . . . . . . . 450 mW

Derates above +75

°C by . . . . . . . . . . . . . . . . . . . 6 mW/°C

Operating Temperature Range

Commercial (J, K, L) Grades . . . . . . . . . . . –40

°C to +85°C

Industrial (A, B, C) Grades . . . . . . . . . . . . –40

°C to +85°C

Extended (S, T, U) Grades . . . . . . . . . . . –55

°C to +125°C

Storage Temperature . . . . . . . . . . . . . . . . . . –65

°C to +150°C

Lead Temperature (Soldering, 10 secs) . . . . . . . . . . . . +300

°C

CAUTION:

1. ESD sensitive device. The digital control inputs are diode

protected; however, permanent damage may occur on uncon-

nected devices subjected to high energy electrostatic fields.

Unused devices must be stored in conductive foam or shunts.

2. Do not insert this device into powered sockets. Remove

power before insertion or removal.

TERMINOLOGY

Relative Accuracy

Relative accuracy or endpoint nonlinearity is a measure of the

maximum deviation from a straight line passing through the

endpoints of the DAC transfer function. It is measured after

adjusting for zero and full scale and is normally expressed in

LSBs or as a percentage of full scale reading.

Differential Nonlinearity

Differential nonlinearity is the difference between the measured

change and the ideal 1 LSB change between any two adjacent

codes. A specified differential nonlinearity of

±1 LSB max over

the operating temperature range ensures monotonicity.

Gain Error

Gain error or full-scale error is a measure of the output error

between an ideal DAC and the actual device output. For the

AD7528

REV. B

–3–

DIP, SOIC

TOP VIEW

(Not to Scale)

20

19

18

17

16

15

14

13

12

11

1

2

3

4

5

6

7

8

9

10

AD7528

DB4

DB5

DB6

OUT A

(MSB) DB7

DAC A/DAC B

DGND

DB3

DB2

DB1

DB0 (LSB)

CS

WR

AGND

OUT B