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74ABT2240 데이터시트(HTML) 2 Page - Fairchild Semiconductor

부품명 74ABT2240
상세내용  Octal Buffer/Line Driver with 25Ω Series Resistors in the Outputs
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제조사  FAIRCHILD [Fairchild Semiconductor]
홈페이지  http://www.fairchildsemi.com
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74ABT2240 데이터시트(HTML) 2 Page - Fairchild Semiconductor

   
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2
Absolute Maximum Ratings(Note 1)
Recommended Operating
Conditions
Note 1: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
Note 3: Guaranteed, but not tested.
Note 4: For 8 bits toggling, ICCD < 0.8 mA/MHz.
Storage Temperature
−65°C to +150°C
Ambient Temperature under Bias
−55°C to +125°C
Junction Temperature under Bias
−55°C to +150°C
VCC Pin Potential to Ground Pin
−0.5V to +7.0V
Input Voltage (Note 2)
−0.5V to +7.0V
Input Current (Note 2)
−30 mA to +5.0 mA
Voltage Applied to Any Output
in the Disabled or
Power-off State
−0.5V to 5.5V
in the HIGH State
−0.5V to V
CC
Current Applied to Output
in LOW State (Max)
twice the rated IOL (mA)
DC Latchup Source Current
(Across Comm Operating Range)
−300 mA
Over Voltage Latchup (I/O)
10V
Free Air Ambient Temperature
−40°C to +85°C
Supply Voltage
+4.5V to +5.5V
Minimum Input Edge Rate (
∆V/∆t)
Data Input
50 mV/ns
Enable Input
20 mV/ns
Symbol
Parameter
Min
Typ
Max
Units
VCC
Conditions
VIH
Input HIGH Voltage
2.0
V
Recognized HIGH Signal
VIL
Input LOW Voltage
0.8
V
Recognized LOW Signal
VCD
Input Clamp Diode Voltage
−1.2
V
Min
IIN = −18 mA
VOH
Output HIGH
2.5
V
Min
IOH = −3 mA
Voltage
2.0
V
Min
IOH = −32 mA
VOL
Output LOW Voltage
0.8
V
Min
IOL = 15 mA
IIH
Input HIGH Current
1
µAMax
VIN = 2.7V (Note 3)
1VIN = V CC
IBVI
Input HIGH Current Breakdown Test
7
µAMax
VIN = 7.0V
I IL
Input LOW Current
−1
µAMax
VIN = 0.5V (Note 3)
−1V
IN = 0.0V
VID
Input Leakage Test
V
0.0
IID = 1.9 µA
All Other Pins Grounded
IOZH
Output Leakage Current
10
µA0 − 5.5V V
OUT = 2.7V; OEn = 2.0V
IOZL
Output Leakage Current
−10
µA0 − 5.5V V
OUT = 0.5V; OEn = 2.0V
IOS
Output Short-Circuit Current
−275
mA
Max
VOUT = 0.0V
ICEX
Output HIGH Leakage Current
50
µAMax
VOUT = V CC
IZZ
Bus Drainage Test
100
µA0.0
VOUT = 5.5V; All Others GND
ICCH
Power Supply Current
50
µA
Max
All Outputs HIGH
ICCL
Power Supply Current
30
mA
Max
All Outputs LOW
ICCZ
Power Supply Current
50
µAMax
OEn
= V
CC
All Others at VCCor GND
ICCT
Additional
Outputs Enabled
1.5
mA
VI = V CC − 2.1V
ICC/Input
Outputs 3-STATE
1.5
mA
Max
Enable Input VI = VCC − 2.1V
Outputs 3-STATE
50
µA
Data Input VI = VCC − 2.1V
All Others at VCCor GND
ICCD
Dynamic ICC
No Load
mA/
Max
Outputs OPEN
(Note 3)
0.1
MHz
OEn
= GND (Note 4)
One Bit Toggling, 50% Duty Cycle


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