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74LVQ02 데이터시트(PDF) 2 Page - Fairchild Semiconductor

부품명 74LVQ02
상세설명  Low Voltage Quad 2-Input NOR Gate
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제조업체  FAIRCHILD [Fairchild Semiconductor]
홈페이지  http://www.fairchildsemi.com
Logo FAIRCHILD - Fairchild Semiconductor

74LVQ02 데이터시트(HTML) 2 Page - Fairchild Semiconductor

  74LVQ02 Datasheet HTML 1Page - Fairchild Semiconductor 74LVQ02 Datasheet HTML 2Page - Fairchild Semiconductor 74LVQ02 Datasheet HTML 3Page - Fairchild Semiconductor 74LVQ02 Datasheet HTML 4Page - Fairchild Semiconductor 74LVQ02 Datasheet HTML 5Page - Fairchild Semiconductor 74LVQ02 Datasheet HTML 6Page - Fairchild Semiconductor  
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Absolute Maximum Ratings (Note 1)
Supply Voltage (V
CC)
−0.5V to +7.0V
DC Input Diode Current (I
IK)
V
I = −0.5V
−20 mA
V
I = VCC + 0.5V
+20 mA
DC Input Voltage (V
I)
−0.5V to V
CC + 0.5V
DC Output Diode Current (I
OK)
V
O = −0.5V
−20 mA
V
O = VCC + 0.5V
+20 mA
DC Output Voltage (V
O)
−0.5V to V
CC + 0.5V
DC Output Source
or Sink Current (I
O)
±50 mA
DC V
CC or Ground Current
(I
CC or IGND)
±200 mA
Storage Temperature (T
STG)
−65˚C to +150˚C
DC Latch-Up Source or
Sink Current
±100 mA
Recommended Operating
Conditions (Note 2)
Supply Voltage (V
CC)
LVQ
2.0V to 3.6V
Input Voltage (V
I)
0VtoV
CC
Output Voltage (V
O)
0VtoV
CC
Operating Temperature (T
A)
74LVQ
−40˚C to +85˚C
Minimum Input Edge Rate (
∆V/∆t)
V
IN from 0.8V to 2.0V
V
CC @ 3.0V
125 mV/ns
Note 1: The “Absolute Maximum Ratings” are those values beyond which
the safety of the device cannot be guaranteed. The device should not be op-
erated at these limits. The parametric values defined in the Electrical Charac-
teristics tables are not guaranteed at the absolute maximum ratings. The
“Recommended Operating Conditions” table will define the conditions for ac-
tual device operation.
Note 2: Unused inputs must be held HIGH or LOW. They may not float.
DC Electrical Characteristics
Symbol
Parameter
VCC
(V)
TA = +25˚C
TA = −40˚C to +85˚C
Units
Conditions
Typ
Guaranteed Limits
VIH
Minimum High Level
Input Voltage
3.0
1.5
2.0
2.0
V
VOUT = 0.1V
or VCC − 0.1V
VIL
Maximum Low Level
Input Voltage
3.0
1.5
0.8
0.8
V
VOUT = 0.1V
or VCC − 0.1V
VOH
Minimum High Level
Output Voltage
3.0
2.99
2.9
2.9
V
IOUT = −50 µA
3.0
2.58
2.48
V
VIN = VIL or VIH (Note 3)
IOH = −12 mA
VOL
Maximum Low Level
Output Voltage
3.0
0.002
0.1
0.1
V
IOUT = 50 µA
3.0
0.36
0.44
V
VIN = VIL or VIH (Note 3)
IOL = 12 mA
IIN
Maximum Input
Leakage Current
3.6
±0.1
±1.0
µA
VI = VCC, GND
IOLD
Minimum Dynamic (Note 4)
Output Current
3.6
36
mA
VOLD = 0.8V Max (Note 5)
IOHD
3.6
−25
mA
VOHD = 2.0V Min (Note 5)
ICC
Maximum Quiescent
Supply Current
3.6
2.0
20.0
µA
VIN = VCC
or GND
VOLP
Quiet Output
Maximum Dynamic VOL
3.3
0.6
1.0
V
(Notes 6, 7)
VOLV
Quiet Output
Minimum Dynamic VOL
3.3
−0.7
−1.0
V
(Notes 6, 7)
VIHD
Maximum High Level
Dynamic Input Voltage
3.3
1.7
2.0
V
(Notes 6, 8)
VILD
Maximum Low Level
Dynamic Input Voltage
3.3
1.7
0.8
V
(Notes 6, 8)
Note 3: All outputs loaded; thresholds on input associated with output under test.
Note 4: Maximum test duration 2.0 ms, one output loaded at a time.
Note 5: Incident wave switching on transmission lines with impedances as low as 75
Ω for commercial temperature range is guaranteed for 74LVQ.
Note 6: Worst case package.
Note 7: Max number of outputs defined as (n). Data inputs are driven 0V to 3.3V; one output at GND.
Note 8: Max number of Data Inputs (n) switching. (n − 1) inputs switching 0V to 3.3V. Input-under-test switching: 3.3V to threshold (VILD), 0V to threshold (VIHD),
f = 1 MHz.
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2


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