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DAC7563SDGSR 데이터시트(PDF) 4 Page - Texas Instruments

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부품명 DAC7563SDGSR
상세설명  DUAL 16-/14-/12-BIT, ULTRALOW-GLITCH, LOW-POWER, BUFFERED, VOLTAGE-OUTPUT DAC WITH 2.5-V, 4-PPM/째C INTERNAL REFERENCE IN SMALL 3-MM3-MM SON
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제조업체  TI1 [Texas Instruments]
홈페이지  http://www.ti.com
Logo TI1 - Texas Instruments

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DAC8562, DAC8563
DAC8162, DAC8163
DAC7562, DAC7563
SLAS719D – AUGUST 2010 – REVISED AUGUST 2012
www.ti.com
ELECTRICAL CHARACTERISTICS
At AVDD = 2.7 V to 5.5 V and TA = –40°C to 125°C (unless otherwise noted).
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
STATIC PERFORMANCE(1)
Resolution
16
Bits
DAC856x
Relative accuracy
Using line passing through codes 512 and 65,024
±4
±12
LSB
Differential nonlinearity
16-bit monotonic
±0.2
±1
LSB
Resolution
14
Bits
DAC816x
Relative accuracy
Using line passing through codes 128 and 16,256
±1
±3
LSB
Differential nonlinearity
14-bit monotonic
±0.1
±0.5
LSB
Resolution
12
Bits
DAC756x
Relative accuracy
Using line passing through codes 32 and 4,064
±0.3
±0.75
LSB
Differential nonlinearity
12-bit monotonic
±0.05
±0.25
LSB
Offset error
Extrapolated from two-point line(1), unloaded
±1
±4
mV
Offset error drift
±2
µV/°C
Full-scale error
DAC register loaded with all 1s
±0.03
±0.2
% FSR
Zero-code error
DAC register loaded with all 0s
1
4
mV
Zero-code error drift
±2
µV/°C
Gain error
Extrapolated from two-point line(1), unloaded
±0.01
±0.15
% FSR
ppm
Gain temperature coefficient
±1
FSR/°C
OUTPUT CHARACTERISTICS(2)
Output voltage range
0
AVDD
V
DACs unloaded
7
Output voltage settling time(3)
µs
RL = 1 MΩ
10
Slew rate
Measured between 20% - 80% of a full-scale transition
0.75
V/µs
RL = ∞
1
Capacitive load stability
nF
RL = 2 kΩ
3
Code-change glitch impulse
1-LSB change around major carry
0.1
nV-s
Digital feedthrough
SCLK toggling, SYNC high
0.1
nV-s
Power-on glitch impulse
RL = 2 kΩ, CL = 470 pF, AVDD = 5.5 V
40
mV
Full-scale swing on adjacent channel,
5
External reference
Channel-to-channel dc crosstalk
µV
Full-scale swing on adjacent channel,
15
Internal reference
DC output impedance
At mid-scale input
5
Ω
DAC outputs at full-scale, DAC outputs shorted to
Short-circuit current
40
mA
GND
Power-up time, including settling time
Coming out of power-down mode
50
µs
AC PERFORMANCE(2)
DAC output noise density
TA = 25°C, at mid-scale input, fOUT = 1 kHz
90
nV/
√Hz
DAC output noise
TA = 25°C, at mid-scale input, 0.1 Hz to 10 Hz
2.6
µVPP
LOGIC INPUTS(2)
Input pin Leakage current
–1
±0.1
1
µA
Logic input LOW voltage VINL
0
0.8
V
0.7 ×
Logic input HIGH voltage VINH
AVDD
V
AVDD
Pin capacitance
3
pF
(1)
16-bit: codes 512 and 65,024; 14-bit: codes 128 and 16,256; 12-bit: codes 32 and 4,064
(2)
Specified by design or characterization
(3)
Transition time between 1/4 scale and 3/4 scale including settling to within ±0.024% FSR
4
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Copyright © 2010–2012, Texas Instruments Incorporated
Product Folder Links: DAC8562 DAC8563 DAC8162 DAC8163 DAC7562 DAC7563


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