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HCPL2530 데이터시트(PDF) 6 Page - Fairchild Semiconductor |
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HCPL2530 데이터시트(HTML) 6 Page - Fairchild Semiconductor |
6 / 12 page ©2005 Fairchild Semiconductor Corporation www.fairchildsemi.com 6N135, 6N136, HCPL2503, HCPL4502, HCPL2530, HCPL2531 Rev. 1.0.7 6 Electrical Characteristics (Continued) (T A = 0 to 70°C unless otherwise specified) Isolation Characteristics (TA = 0 to 70°C Unless otherwise specified) Notes: 9. Device is considered a two terminal device: Pins 1, 2, 3 and 4 are shorted together and Pins 5, 6, 7 and 8 are shorted together. 10. Measured between pins 1 and 2 shorted together, and pins 3 and 4 shorted together. Symbol Characteristics Test Conditions Min Typ** Max Unit II-O Input-Output Insulation Leakage Current Relative humidity = 45%, TA = 25°C, t = 5s, VI-O = 3000 VDC (9) 1.0 µA VISO Withstand Insulation Test Voltage RH ≤ 50%, T A = 25°C, II-O ≤ 2µA, t = 1 min.(9) 2500 VRMS RI-O Resistance (Input to Output) VI-O = 500VDC (9) 1012 Ω CI-O Capacitance (Input to Output) f = 1MHz(9) 0.6 pF HFE DC Current Gain IO = 3mA, VO = 5V (9) 150 II-I Input-Input Insulation Leakage Current RH ≤ 45%, V I-I = 500VDC (10) t = 5 s, (HCPL2530/2531 only) 0.005 µA RI-I Input-Input Resistance VI-I = 500 VDC (10) (HCPL2530/2531 only) 1011 Ω CI-I Input-Input Capacitance f = 1MHz)(10) (HCPL2530/2531 only) 0.03 pF |
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