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AD7564ARS-B 데이터시트(PDF) 8 Page - Analog Devices

부품명 AD7564ARS-B
상세설명  LC2MOS 3.3 V/5 V, Low Power, Quad 12-Bit DAC
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REV.
AD7564
–8–
Table II. DAC Selection
DS1
DS0
Function
0
0
DAC A Selected
0
1
DAC B Selected
1
0
DAC C Selected
1
1
DAC D Selected
Output Voltage Settling Time
This is the amount of time it takes for the output to settle to a
specified level for a full-scale input change. For the AD7564, it
is specified with the AD843 as the output op amp.
Digital to Analog Glitch Impulse
This is the amount of charge injected into the analog output
when the inputs change state. It is normally specified as the
area of the glitch in either pA-secs or nV-secs, depending upon
whether the glitch is measured as a current or voltage signal. It
is measured with the reference input connected to AGND and
the digital inputs toggled between all 1s and all 0s.
AC Feedthrough Error
This is the error due to capacitive feedthrough from the DAC
reference input to the DAC IOUT terminal, when all 0s are
loaded in the DAC.
Channel-to-Channel Isolation
Channel-to-channel isolation refers to the proportion of input
signal from one DAC’s reference input which appears at the
output of any other DAC in the device and is expressed in dBs.
Digital Crosstalk
The glitch impulse transferred to the output of one converter
due to a change in digital input code to the other converter is
defined as the Digital Crosstalk and is specified in nV-secs.
Digital Feedthrough
When the device is not selected, high frequency logic activity on
the device digital inputs is capacitively coupled through the de-
vice to show up at on the IOUT pin and subsequently on the op
amp output. This noise is digital feedthrough.
TERMINOLOGY
Relative Accuracy
Relative accuracy or endpoint linearity is a measure of the
maximum deviation from a straight line passing through the
endpoints of the DAC transfer function. It is measured after ad-
justing for zero error and full-scale error and is normally ex-
pressed in Least Significant Bits or as a percentage of full-scale
reading.
Differential Nonlinearity
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of 1 LSB maximum
ensures monotonicity.
Gain Error
Gain error is a measure of the output error between an ideal
DAC and the actual device output. It is measured with all 1s
in the DAC after offset error has been adjusted out and is ex-
pressed in Least Significant Bits. Gain error is adjustable to
zero with an external potentiometer.
Output Leakage Current
Output leakage current is current which flows in the DAC
ladder switches when these are turned off. For the IOUT1
terminal, it can be measured by loading all 0s to the DAC and
be measured by loading all 0s to the DAC and measuring the IOUT1
current. Minimum current will flow in the IOUT2 line when the
DAC is loaded with all 1s. This is a combination of the switch
leakage current and the ladder termination resistor current.
The IOUT2 leakage current is typically equal to that in IOUT1.
Output Capacitance
This is the capacitance from the IOUT1 pin to AGND.
Table I. AD7564 Loading Sequence
DB15
DB0
DB11 DB10
DB9
DB8
DB7
DB6
DB5
DB4
DB3
DB2
DB1
DB0
A1
A0
DS1
DS0
B


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