STANDARD

MICROCIRCUIT DRAWING

SIZE

A

5962-94686

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

A

SHEET

6

DSCC FORM 2234

APR 97

TABLE I. Electrical performance characteristics – Continued.

Test

Symbol

Conditions 1/

-55

unless otherwise specified

Group A

subgroups

Device

type

Limits 2/

Unit

Min

Max

Logic input low current

(CLK)

01

±10

Logic input low current

(OEN, CLK)

1,2,3

02

±10

µA

Logic output high voltage

( MSB -Bit 12, OTR)

µA

1,2,3

01,02

2.4

V

Logic output low voltage

( MSB -Bit 12, OTR)

1,2,3

01,02

0.4

V

Leakage

Three-state

1,2,3

02

±10

µA

Clock period

Duty cycle = 50%,

See figure 2

9,10,11

01,02

200

ns

Output delay

See figure 2

9,10,11

01,02

10

ns

2/ The limiting term “min” (minimum) and “max” (maximum) shall be considered to apply to magnitudes only. Negative current

shall be defined as conventional current flow out of a device terminal.

3/ Minimum resolution for which “no missing codes” is guaranteed.

4/ Test conditions for PSRR: 4.75 V

4. QUALITY ASSURANCE PROVISIONS

4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with

MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan

shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be

in accordance with MIL-PRF-38535, appendix A.

4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted

on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in

accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.

4.2.1 Additional criteria for device class M.

a.

Burn-in test, method 1015 of MIL-STD-883.

(1) Test condition B. The test circuit shall be maintained by the manufacturer under document revision level control

and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the

inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test

method 1015.

°C, minimum.

b.

Interim and final electrical test parameters shall be as specified in table II herein.