Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur.

Note 2: Operating Ratings indicate conditions for which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and

test conditions, see the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may

degrade when the device is not operated under the listed test conditions.

Note 3: All voltages are measured with respect to GND, unless otherwise specified.

20 mA maximum package input current rating limits the number of pins that can safely exceed the power supplies with an input current of 5 mA to four.

CIJ and CMJ suffixes 49˚C/W, ADC10154 with BIWM and CIWM suffixes 72˚C/W, ADC10158 with BIN and CIN suffixes 59˚C/W, ADC10158 with BIJ, CIJ, and CMJ

suffixes 46˚C/W, ADC10158 with BIWM and CIWM suffixes 68˚C/W.

Note 6: Human body model, 100 pF capacitor discharged through a 1.5 k

Ω resistor.

Note 7: See AN-450 “Surface Mounting Methods and Their Effect on Product Reliability” or the section titled “Surface Mount” found in any post-1986 National

Semiconductor Linear Data Book for other methods of soldering surface mount devices.

especially at elevated temperatures, which will cause errors for analog inputs near full-scale. The specification allows 50 mV forward bias of either diode; this means

Note 11: Tested limits are guaranteed to National’s AOQL (Average Outgoing Quality Level).

Note 12: One LSB is referenced to 10 bits of resolution.

Note 13: Total unadjusted error includes offset, full-scale, linearity, multiplexer, and hold step errors.

Note 14: For DC Common Mode Error the only specification that is measured is offset error.

Note 15: Channel leakage current is measured after the channel selection.

DS011225-4

DS011225-5

www.national.com

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