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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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74HC00-Q100 데이터시트(PDF) 8 Page - NXP Semiconductors |
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74HC00-Q100 데이터시트(HTML) 8 Page - NXP Semiconductors |
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8 / 15 page  74HC_HCT00_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved. Product data sheet Rev. 1 — 12 July 2012 8 of 15 NXP Semiconductors 74HC00-Q100; 74HCT00-Q100 Quad 2-input NAND gate Test data is given in Table 9. Definitions test circuit: RT = termination resistance should be equal to output impedance Zo of the pulse generator. CL = load capacitance including jig and probe capacitance. Fig 7. Test circuit for measuring switching times 001aah768 tW tW tr tr tf VM VI negative pulse GND VI positive pulse GND 10 % 90 % 90 % 10 % VM VM VM tf VCC DUT RT VI VO CL G Table 9. Test data Type Input Load Test VI tr, tf CL 74HC00-Q100 VCC 6.0 ns 15 pF, 50 pF tPLH, tPHL 74HCT00-Q100 3.0 V 6.0 ns 15 pF, 50 pF tPLH, tPHL |
유사한 부품 번호 - 74HC00-Q100 |
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유사한 설명 - 74HC00-Q100 |
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