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GT28F800B3-T120 데이터시트(PDF) 11 Page - Intel Corporation

부품명 GT28F800B3-T120
상세설명  SMART 3 ADVANCED BOOT BLOCK WORD-WIDE
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제조업체  INTEL [Intel Corporation]
홈페이지  http://www.intel.com
Logo INTEL - Intel Corporation

GT28F800B3-T120 데이터시트(HTML) 11 Page - Intel Corporation

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E
SMART 3 ADVANCED BOOT BLOCK–WORD-WIDE
11
PRELIMINARY
Table 2. 16-Mbit Smart 3 Advanced Boot Block Pin Descriptions (Continued)
Symbol
Type
Name and Function
VCCQ
INPUT
OUTPUT VCC: Enables all outputs to be driven to 2.0V ±10% while the
VCC is at 2.7V. When this mode is used, the VCC should be regulated to
2.7V–2.85V to achieve lowest power operation (see Section 6.1: DC
Characteristics: VCCQ = 1.8V–2.2V).
This input may be tied directly to VCC (2.7V–3.6V).
See the DC Characteristics for further details.
VCC
DEVICE POWER SUPPLY: 2.7V–3.6V
VPP
PROGRAM/ERASE POWER SUPPLY: For erasing memory array
blocks or programming data in each block, a voltage of either 2.7V–3.6V
or 12V
± 5% must be applied to this pin. When VPP < VPPLK all blocks
are locked and protected against Program and Erase commands.
Applying 11.4V-12.6V to VPP can only be done for a maximum of 1000
cycles on the main blocks and 2500 cycles on the parameter blocks.
VPP may be connected to 12V for a total of 80 hours maximum (see
Section 3.4 for details).
GND
GROUND: For all internal circuitry. All ground inputs must be
connected.
NC
NO CONNECT: Pin may be driven or left floating.
2.2
Block Organization
The
Smart
3
Advanced
Boot
Block
is
an
asymmetrically-blocked architecture that enables
system integration of code and data within a single
flash
device.
Each
block
can
be
erased
independently of the others up to 10,000 times. For
the address locations of each block, see the
memory maps in Figure 5 (top boot blocking) and
Figure 6 (bottom boot blocking).
2.2.1
PARAMETER BLOCKS
The Smart 3 Advanced Boot Block flash memory
architecture includes parameter blocks to facilitate
storage of frequently updated small parameters
(e.g., data that would normally be stored in an
EEPROM). By using software techniques, the word-
rewrite functionality of EEPROMs can be emulated.
Each 4-/8-/16-Mbit device contains eight parameter
blocks of 4-Kwords (4,096-words) each.
2.2.2
MAIN BLOCKS
After the parameter blocks, the remainder of the
array is divided into equal size main blocks for data
or code storage. Each 16-Mbit device contains
thirty-one 32-Kword (32,768-word) blocks. Each
8-Mbit device contains fifteen 32-Kword blocks.
Each 4-Mbit device contains seven 32-Kword
blocks.


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