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LM117JAN-SP 데이터시트(PDF) 3 Page - Texas Instruments

부품명 LM117JAN-SP
상세설명  LM117JAN 3-Terminal Adjustable Regulator
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LM117JAN
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SNVS365A – MARCH 2006 – REVISED MARCH 2013
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
Absolute Maximum Ratings
(1)
Power Dissipation (2)
Internally Limited
Input-Output Voltage Differential
+40V,
−0.3V
Storage Temperature
−65°C ≤ TA ≤ +150°C
Maximum Junction Temperature (TJmax)
+150°C
Lead Temperature
Metal Package
300°C
Thermal Resistance
θJA
TO–3 Still Air
39°C/W
TO–3 500LF/Min Air flow
14°C/W
TO Still Air
186°C/W
TO 500LF/Min Air flow
64°C/W
θJC
TO–3
1.9°C/W
TO Metal Can
21°C/W
ESD Tolerance (3)
3KV
(1)
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the
Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may
degrade when the device is not operated under the listed test conditions.
(2)
The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature),
θJA (package junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any
temperature is PDmax = (TJmax - TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is lower. "Although power
dissipation is internally limited, these specifications are applicable for power dissipations of 2W for the TO package and 20W for the TO-
3 package."
(3)
Human body model, 100 pF discharged through a 1.5 k
Ω resistor.
Recommended Operating Conditions
Operating Temperature Range
−55°C ≤ TA ≤ +125°C
Input Voltage Range
4.25V to 41.25V
Quality Conformance Inspection
MIL-STD-883, Method 5005 - Group A
Subgroup
Description
Temp °C
1
Static tests at
25
2
Static tests at
125
3
Static tests at
-55
4
Dynamic tests at
25
5
Dynamic tests at
125
6
Dynamic tests at
-55
7
Functional tests at
25
8A
Functional tests at
125
8B
Functional tests at
-55
9
Switching tests at
25
10
Switching tests at
125
11
Switching tests at
-55
12
Settling time at
25
13
Settling time at
125
14
Settling time at
-55
Copyright © 2006–2013, Texas Instruments Incorporated
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