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LM25011AMYX 데이터시트(PDF) 4 Page - Texas Instruments |
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LM25011AMYX 데이터시트(HTML) 4 Page - Texas Instruments |
4 / 29 page LM25011, LM25011-Q1, LM25011A, LM25011A-Q1 SNVS617H – APRIL 2009 – REVISED NOVEMBER 2014 www.ti.com 6 Specifications 6.1 Absolute Maximum Ratings (1) MIN MAX UNIT VIN to SGND (TJ = 25°C) 45 V BST to SGND 52 V SW to SGND (Steady State) –1.5 45 V BST to SW –0.3 7 V CS to CSG –0.3 0.3 V CSG to SGND –0.3 0.3 V PGD to SGND –0.3 7 V SS to SGND –0.3 3 V RT to SGND –0.3 1 V FB to SGND –0.3 7 V For soldering specs, see www.ti.com/packaging. Junction Temperature 150 °C (1) Absolute Maximum Ratings(1) are limits beyond which damage to the device may occur. Recommended Operating Conditions are conditions under which operation of the device is intended to be functional. For specifications and test conditions, see the Electrical Characteristics . 6.2 Handling Ratings: LM25011 MIN MAX UNIT Tstg Storage temperature range –65 150 °C Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, 2000 all pins(1) V(ESD) Electrostatic discharge V Charged device model (CDM), per JEDEC specification 750 JESD22-C101, all pins(2) (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 6.3 Handling Ratings: LM25011-Q1 MIN MAX UNIT Tstg Storage temperature range –65 150 °C Human body model (HBM), per AEC Q100-002(1) 2000 Corner pins (1, 5, 6, 750 V(ESD) Electrostatic discharge V Charged device model (CDM), per and 10) AEC Q100-011 Other pins 750 (1) AEC Q100-002 indicates HBM stressing is done in accordance with the ANSI/ESDA/JEDEC JS-001 specification. 6.4 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) (1) MIN MAX UNIT VIN Voltage 6.0 42 V Junction Temperature –40 125 °C (1) Absolute Maximum Ratings(1) are limits beyond which damage to the device may occur. Recommended Operating Conditions are conditions under which operation of the device is intended to be functional. For specifications and test conditions, see the Electrical Characteristics . 4 Submit Documentation Feedback Copyright © 2009–2014, Texas Instruments Incorporated Product Folder Links: LM25011 LM25011-Q1 LM25011A LM25011A-Q1 |
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