N01S818HAT22I datasheet(8/12 Pages) ONSEMI

부품명	N01S818HAT22I

상세설명	1 Mb Ultra-Low Power Serial SRAM

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N01S818HA

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Figure 14. QUAD Write Mode Register Sequence

CS

Instruction

03

2

1

SCK

C1 C0

H

L

C[1:0] = 01h

Notes:

MSB

Mode Bits

SIO[3:0]

Table 5. MODE REGISTER

Bit

Function

0

Hold Function

1 = Hold function disabled

0 = Hold function enabled (Default)

1

Reserved

2

Reserved

3

Reserved

4

Reserved

5

Reserved

6

Operating Mode

Bit 7

Bit 6

0

0 = Word Mode

1

0 = Page Mode

0

1 = Burst Mode (Default)

1

1 = Reserved

7

Power-Up State

The serial SRAM enters a know state at power-up time.

The device is in low-power standby state with CS = 1. A low

level on CS is required to enter a active state.

Table 6. ABSOLUTE MAXIMUM RATINGS

Item

Symbol

Rating

Units

Voltage on any pin relative to VSS

VIN,OUT

–0.3 to VCC +0.3

V

Voltage on VCC Supply Relative to VSS

VCC

–0.3 to 5.5

V

Power Dissipation

PD

500

mW

Storage Temperature

TSTG

–40 to 125

°C

Operating Temperature

TA

-40 to +85

°C

Soldering Temperature and Time

TSOLDER

260°C, 10 sec

°C

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

Table 7. OPERATING CHARACTERISTICS (OVER SPECIFIED TEMPERATURE RANGE)

Item

Symbol

Test Conditions

Min

Typ (Note 1)

Max

Units

Supply Voltage

VCC

1.7

2.2

V

Data Retention Voltage (Note 2)

VDR

1.0

V

Input High Voltage

VIH

0.7 VCC

VCC + 0.3

Input Low Voltage

VIL

−0.3

0.2 VCC

V

Output High Voltage

VOH

IOH = −0.4 mA

VCC − 0.2

V

Output Low Voltage

VOL

IOL = 1 mA

0.2

V

Input Leakage Current

ILI

CS = VCC, VIN = 0 to VCC

1.0

mA

Output Leakage Current

ILO

CS = VCC, VOUT = 0 to VCC

1.0

mA

Operating Current

ICC

f = 20 MHz, IOUT = 0, SPI / DUAL

10

mA

f = 20 MHz, IOUT = 0, QUAD

10

Standby Current

ISB

CS = VCC, VIN = VSS or VCC

1

5

mA

1. Typical values are measured at VCC = VCC Typ., TA = 25°C and are not 100% tested.

2. Typical lower limit of VCC when data will be retained in the memory array, not 100% tested.

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