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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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LM35DZ 데이터시트(PDF) 9 Page - Texas Instruments |
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LM35DZ 데이터시트(HTML) 9 Page - Texas Instruments |
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9 / 31 page  LM35 www.ti.com SNIS159F – AUGUST 1999 – REVISED JANUARY 2016 6.8 Electrical Characteristics: LM35, LM35C, LM35D Unless otherwise noted, these specifications apply: −55°C ≤ TJ ≤ 150°C for the LM35 and LM35A; −40°C ≤ TJ ≤ 110°C for the LM35C and LM35CA; and 0°C ≤ TJ ≤ 100°C for the LM35D. VS = 5 Vdc and ILOAD = 50 μA, in the circuit of Full-Range Centigrade Temperature Sensor. These specifications also apply from 2°C to TMAX in the circuit of Figure 14. LM35 LM35C, LM35D PARAMETER TEST CONDITIONS UNIT MIN TYP MAX MIN TYP MAX ±0.4 ±0.4 TA = 25°C Tested Limit(2) ±1 ±1 Design Limit(3) ±0.5 ±0.5 TA = –10°C Tested Limit(2) Design Limit(3) ±1.5 Accuracy, LM35, °C LM35C(1) ±0.8 ±0.8 TA = TMAX Tested Limit(2) ±1.5 Design Limit(3) ±1.5 ±0.8 ±0.8 TA = TMIN Tested Limit(2) Design Limit(3) ±1.5 ±2 ±0.6 TA = 25°C Tested Limit(2) ±1.5 Design Limit(3) ±0.9 Accuracy, TA = TMAX Tested Limit(2) °C LM35D(1) Design Limit(3) ±2 ±0.9 TA = TMIN Tested Limit(2) Design Limit(3) ±2 ±0.3 ±0.2 TMIN ≤ TA ≤ TMAX, Nonlinearity(4) Tested Limit(2) °C –40°C ≤ TJ ≤ 125°C Design Limit(3) ±0.5 ±0.5 10 10 TMIN ≤ TA ≤ TMAX, Tested Limit(2) 9.8 –40°C ≤ TJ ≤ 125°C Design Limit(3) 9.8 Sensor gain mV/°C (average slope) 10 10 Tested Limit(2) 10.2 Design Limit(3) 10.2 ±0.4 ±0.4 TA = 25°C Tested Limit(2) ±2 ±2 Design Limit(3) Load regulation(5) mV/mA 0 ≤ IL ≤ 1 mA ±0.5 ±0.5 TMIN ≤ TA ≤ TMAX, Tested Limit(2) –40°C ≤ TJ ≤ 125°C Design Limit(3) ±5 ±5 (1) Accuracy is defined as the error between the output voltage and 10 mv/°C times the case temperature of the device, at specified conditions of voltage, current, and temperature (expressed in °C). (2) Tested Limits are ensured and 100% tested in production. (3) Design Limits are ensured (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to calculate outgoing quality levels. (4) Non-linearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated temperature range of the device. (5) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance. Copyright © 1999–2016, Texas Instruments Incorporated Submit Documentation Feedback 9 Product Folder Links: LM35 |
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