전자부품 데이터시트 검색엔진 |
|
SI5346 데이터시트(PDF) 4 Page - Silicon Laboratories |
|
SI5346 데이터시트(HTML) 4 Page - Silicon Laboratories |
4 / 59 page Si5347/46 4 Rev. 1.1 2. Electrical Specifications Table 1. Recommended Operating Conditions (VDD =1.8 V ±5%, VDDA =3.3 V ±5%,TA = –40 to 85 °C) Parameter Symbol Min Typ Max Unit Ambient Temperature TA –40 25 85 °C Junction Temperature TJMAX —— 125 °C Core Supply Voltage VDD 1.71 1.80 1.89 V VDDA 3.14 3.30 3.47 V Output Driver Supply Voltage VDDO 3.14 3.30 3.47 V 2.38 2.50 2.62 V 1.71 1.80 1.89 V Status Pin Supply Voltage VDDS 3.14 3.30 3.47 V 1.71 1.80 1.89 V Note: All minimum and maximum specifications are guaranteed and apply across the recommended operating conditions. Typical values apply at nominal supply voltages and an operating temperature of 25 °C unless otherwise noted. Table 2. DC Characteristics (VDD =1.8 V ±5%, VDDA =3.3 V ±5%, VDDO = 1.8 V ±5%, 2.5 V ±5%, or 3.3 V ±5%, TA = –40 to 85 °C) Parameter Symbol Test Condition Min Typ Max Unit Core Supply Current IDD Si5347 Notes 1, 2 — 175 240 mA Si5346 — 170 230 mA IDDA Si5347 — 120 130 mA Si5346 120 130 mA Notes: 1. Si5347 test configuration: 7 x 2.5 V LVDS outputs enabled @156.25 MHz. Excludes power in termination resistors. 2. Si5346 test configuration: 4 x 2.5 V LVDS outputs enabled @ 156.25 MHz. Excludes power in termination resistors. 3. Differential outputs terminated into an AC coupled 100 load. 4. LVCMOS outputs measured into a 5-inch 50 PCB trace with 5 pF load. The LVCMOS outputs were set to OUTx_CMOS_DRV = 3, which is the strongest driver setting. Refer to the Si5347/46 Family Reference Manual for more details on register settings. 5. Detailed power consumption for any configuration can be estimated using ClockBuilder Pro when an evaluation board (EVB) is not available. All EVBs support detailed current measurements for any configuration. 50 50 100 OUT OUT IDDO Differential Output Test Configuration 0.1 µF 0.1 µF 50 OUT OUT IDDO Trace length 5 inches 50 4.7 pF 499 56 4.7 pF 499 56 50 Scope Input 50 Scope Input 0.1 µF 0.1 µF LVCMOS Output Test Configuration |
유사한 부품 번호 - SI5346 |
|
유사한 설명 - SI5346 |
|
|
링크 URL |
개인정보취급방침 |
ALLDATASHEET.CO.KR |
ALLDATASHEET 가 귀하에 도움이 되셨나요? [ DONATE ] |
Alldatasheet는? | 광고문의 | 운영자에게 연락하기 | 개인정보취급방침 | 링크교환 | 제조사별 검색 All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |