Si826x

Rev. 1.3

9

2. Regulatory Information

Table 3. Regulatory Information*

CSA

The Si826x is certified under CSA Component Acceptance Notice 5A. For more details, see File 232873.

age.

VDE

The Si826x is certified according to IEC60747 and VDE0884. For more details, see File 5006301-4880-0001.

UL

The Si826x is certified under UL1577 component recognition program. For more details, see File E257455.

CQC

The Si826x is certified under GB4943.1-2011. For more details, see certificates CQC14001104575,

CQC15001121282 and CQC15001121283.

*Note:

For more information, see "8.Ordering Guide" on page 23.

Table 4. Insulation and Safety-Related Specifications

Parameter

Symbol

Test Condition

Value

Unit

SOIC-8

DIP8

SDIP6

LGA8

Nominal Air Gap (Clearance)

L(IO1)

4.7 min

7.2 min

9.6 min

10.0 min

mm

Nominal External Tracking

(Creepage)

L(IO2)

3.9 min

7.0 min

8.3 min

10.0 min

mm

Minimum Internal Gap

(Internal Clearance)

0.016

0.016

0.016

0.016

mm

Tracking Resistance

(Proof Tracking Index)

PTI

IEC60112

600

600

600

600

V

Erosion Depth

ED

0.031

0.031

0.057

0.021

mm

Resistance (Input-Output)*



Capacitance (Input-Output)*

f = 1 MHz

1

111

pF

*Note:

To determine resistance and capacitance, the Si826x is converted into a 2-terminal device. Pins 1–4 (1–3, SDIP6) are

shorted together to form the first terminal, and pins 5–8 (4–6, SDIP6) are shorted together to form the second terminal.

The parameters are then measured between these two terminals.