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54ACTQ02 데이터시트(HTML) 2 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
부품명 54ACTQ02
상세내용  Quad 2-Input NOR Gate
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제조사  NSC [National Semiconductor (TI)]
홈페이지  http://www.national.com
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54ACTQ02 데이터시트(HTML) 2 Page - National Semiconductor (TI)

   
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Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage (V
CC)
−0.5V to +7.0V
DC Input Diode Current (I
IK)
V
I = −0.5V
−20 mA
V
I = VCC + 0.5V
+20 mA
DC Input Voltage (V
I)
−0.5V to V
CC + 0.5V
DC Output Diode Current (I
OK)
V
O = −0.5V
−20 mA
V
O = VCC + 0.5V
+20 mA
DC Output Voltage (V
O)
−0.5V to V
CC + 0.5V
DC Output Source
or Sink Current (I
O)
±50 mA
DC V
CC or Ground Current
per Output Pin (I
CC or IGND)
±50 mA
Storage Temperature (T
STG)
−65˚C to +150˚C
DC Latch-Up Source or
Sink Current
±300 mA
Junction Temperature (T
J)
CDIP
175˚C
Recommended Operating
Conditions
Supply Voltage (V
CC)
’ACTQ
4.5V to 5.5V
Input Voltage (V
I)
0VtoV
CC
Output Voltage (V
O)
0VtoV
CC
Operating Temperature (T
A)
54ACTQ
−55˚C to +125˚C
Minimum Input Edge Rate (
∆V/∆t)
’ACTQ Devices
V
IN from 0.8V to 2.0V
V
CC @ 4.5V, 5.5V
125 mV/ns
Note 1: Absolute maximum ratings are those values beyond which damage
to the device may occur. The databook specifications should be met, without
exception, to ensure that the system design is reliable over its power supply,
temperature, and output/input loading variables. National does not recom-
mend operation of FACTcircuits outside databook specifications.
DC Characteristics for ’ACTQ Family Devices
54ACTQ
Symbol
Parameter
V
CC
T
A =
Units
Conditions
(V)
−55˚C to +125˚C
Guaranteed Limits
V
IH
Minimum High Level
4.5
2.0
V
V
OUT = 0.1V
Input Voltage
5.5
2.0
or V
CC − 0.1V
V
IL
Maximum Low Level
4.5
0.8
V
V
OUT = 0.1V
Input Voltage
5.5
0.8
or V
CC − 0.1V
V
OH
Minimum High Level
4.5
4.4
V
I
OUT = −50 µA
Output Voltage
5.5
5.4
V
IN = VIL or VIH
4.5
3.70
V
I
OH = −24 mA
5.5
4.70
I
OH = −24 mA
V
OL
Maximum Low Level
4.5
0.1
V
I
OUT = 50 µA
Output Voltage
5.5
0.1
V
IN = VIL or VIH
4.5
0.50
V
I
OL =24mA
5.5
0.50
I
OL =24mA
I
IN
Maximum Input
5.5
±1.0
µA
V
I = VCC, GND
Leakage Current
I
CCT
Maximum I
CC/Input
5.5
1.6
mA
V
I = VCC − 2.1V
I
OLD
Minimum Dynamic
5.5
50
mA
V
OLD = 1.65V Max
I
OHD
Output Current (Note 2)
5.5
−50
mA
V
OHD = 3.85V Min
I
CC
Maximum Quiescent
5.5
40.0
µA
V
IN = VCC or GND
Supply Current
(Note 3)
V
OLP
Quiet Output
5.0
1.5
V
Maximum Dynamic V
OL
(Note 4)
V
OLV
Quiet Output
5.0
-1.2
V
Minimum Dynamic V
OL
(Note 4)
Note 2: Maximum test duration 2.0 ms, one output loaded at a time.
Note 3: ICC for 54ACTQ @ 25˚C is identical to 74ACTQ @ 25˚C.
Note 4: Max number of outputs defined as (n). Data inputs are 0V to 3V. One output @ GND.
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