Si4840/44-A10

Rev.1.0

9

Table 6. AM/SW Receiver Characteristics1, 2

Parameter

Symbol

Test Condition

Min

Typ

Max

Unit

Input Frequency

Medium Wave (AM)

504

—

1750

kHz

Short Wave (SW)

2.3

—

28.5

MHz

Sensitivity3,4,5

(S+N)/N = 26 dB

—

30

—

µV EMF

Large Signal Voltage Handling5

THD < 8%

—

300

—

Power Supply Rejection Ratio5

—

40

—

dB

Audio Output Voltage3,6,8

—

60

—

Audio S/N3,4,6

—

55

—

dB

Audio THD3,6

—

0.1

0.5

%

Antenna Inductance5,7

180

—

450

µH

Powerup/Band Switch Time5

From powerdown

—

—

110

ms

Notes:

1.

Additional testing information is available in “AN603: Si4840/44 DEMO Board Test Procedure.” Volume = maximum

for all tests. Tested at RF = 520 kHz.

2.

To ensure proper operation and receiver performance, follow the guidelines in “AN602: Si484x-A Antenna, Schematic,

Layout, and Design Guidelines.” Silicon Laboratories will evaluate schematics and layouts for qualified customers.

3.

FMOD = 1 kHz, 30% modulation, 2 kHz channel filter.

4.

5.

Guaranteed by characterization.

6.

7.

Stray capacitance on antenna and board must be < 10 pF to achieve full tuning range at higher inductance levels.

8.

Tested in Digital Volume Mode.

Table 7. Reference Clock and Crystal Characteristics

Parameter

Symbol

Test Condition

Min

Typ

Max

Unit

Reference Clock

XTALI Supported Reference Clock

Frequencies

—

32.768

—

kHz

Reference Clock Frequency

Tolerance for XTALI

–100

—

100

ppm

Crystal Oscillator

Crystal Oscillator Frequency

—

32.768

—

kHz

Crystal Frequency Tolerance

–100

—

100

ppm

Board Capacitance

——

3.5

pF