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ADC121S655 데이터시트(PDF) 5 Page - Texas Instruments

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부품명 ADC121S655
상세설명  12-Bit, 200 kSPS to 500 kSPS, Differential Input, Micro Power A/D Converter
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ADC121S655
www.ti.com
SNAS402A – MAY 2007 – REVISED MARCH 2013
ADC121S655 Converter Electrical Characteristics
(1) (continued)
The following specifications apply for VA = +4.5V to 5.5V, VREF = 2.5V, fSCLK = 3.2 to 8 MHz, fIN = 100 kHz, CL = 25 pF, unless
otherwise noted. Boldface limits apply for TA = TMIN to TMAX; all other limits are at TA = 25°C.
Symbol
Parameter
Conditions
Typical
Limits
Units(2)
4.5
V (min)
VA
Analog Supply Voltage
5.5
V (max)
fSCLK = 8 MHz, fS = 500 kSPS, fIN = 100
1.8
2.2
mA (max)
kHz
IVA
Supply Current, Normal Mode
(Normal)) (Operational)
fSCLK = 3.2 MHz, fS = 200 kSPS, fIN = 100
1.4
mA
kHz
fSCLK = 8 MHz
32
µA (max)
Supply Current, Power Down Mode
IVA (PD)
(CS high)
fSCLK = 0
(1)
0.3
2
µA (max)
fSCLK = 8 MHz, fS = 500 kSPS, fIN = 100
9
mW
kHz, VA = 5.0V
PWR
Power Consumption, Normal Mode
(Normal)) (Operational)
fSCLK = 3.2 MHz, fS = 200 kSPS, fIN = 100
7
mW
kHz, VA = 5.0V
fSCLK = 8 MHz, VA = 5.0V
200
µW
PWR
Power Consumption, Power Down
(PD)
Mode (CS high)
fSCLK = 0, VA = 5.0V
1.5
µW
See the Specification Definitions for the test
PSRR
Power Supply Rejection Ratio
−85
dB
condition
AC ELECTRICAL CHARACTERISTICS
fSCLK
Maximum Clock Frequency
16
8
MHz (min)
fSCLK
Minimum Clock Frequency
0.8
3.2
MHz (max)
fS
Maximum Sample Rate(3)
1000
500
kSPS (min)
SCLK cycles
2.5
(min)
tACQ
Track/Hold Acquisition Time
SCLK cycles
3.0
(max)
tCONV
Conversion Time
13
SCLK cycles
tAD
Aperture Delay
See the Specification Definitions
6
ns
(3)
While the maximum sample rate is fSCLK/16, the actual sample rate may be lower than this by having the CS rate slower than fSCLK/16.
ADC121S655 Timing Specifications
(1)
The following specifications apply for VA = +4.5V to 5.5V, VREF = 2.5V, fSCLK = 3.2 MHz to 8 MHz, CL = 25 pF, Boldface limits
apply for TA = TMIN to TMAX: all other limits TA = 25°C.
Symbol
Parameter
Conditions
Typical
Limits
Units
tCSH
CS Hold Time after an SCLK rising edge
5
ns (min)
tCSSU
CS Setup Time prior to an SCLK rising edge
5
ns (min)
tDH
DOUT Hold time after an SCLK Falling edge
7
2.5
ns (min)
tDA
DOUT Access time after an SCLK Falling edge
18
22
ns (max)
tDIS
DOUT Disable Time after the rising edge of CS
(2)
20
ns (max)
tEN
DOUT Enable Time after the falling edge of CS
8
20
ns (max)
tCH
SCLK High Time
25
ns (min)
tCL
SCLK Low Time
25
ns (min)
tr
DOUT Rise Time
7
ns
tf
DOUT Fall Time
7
ns
(1)
Data sheet min/max specification limits are specified by design, test, or statistical analysis.
(2)
tDIS is the time for DOUT to change 10% while being loaded by the Timing Test Circuit.
Copyright © 2007–2013, Texas Instruments Incorporated
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