74AC11244

OCTAL BUFFER/DRIVER

WITH 3-STATE OUTPUTS

SCAS171B – MARCH 1987 – REVISED SEPTEMBER 1998

3

POST OFFICE BOX 655303

recommended operating conditions (see Note 3)

MIN

NOM

MAX

UNIT

VCC

Supply voltage

3

5

5.5

V

VCC = 3 V

2.1

VIH

High-level input voltage

VCC = 4.5 V

3.15

V

VCC = 5.5 V

3.85

VCC = 3 V

0.9

VIL

Low-level input voltage

VCC = 4.5 V

1.35

V

VCC = 5.5 V

1.65

VI

Input voltage

0

VCC

V

VO

Output voltage

0

VCC

V

VCC = 3 V

–4

IOH

High-level output current

VCC = 4.5 V

–24

mA

VCC = 5.5 V

–24

VCC = 3 V

12

IOL

Low-level output current

VCC = 4.5 V

24

mA

VCC = 5.5 V

24

∆t/∆v

Input transition rise or fall rate

0

10

ns/V

TA

Operating free-air temperature

–40

85

°C

NOTE 3: All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,

Implications of Slow or Floating CMOS Inputs, literature number SCBA004.

electrical characteristics over recommended operating free-air temperature range (unless

otherwise noted)

PARAMETER

TEST CONDITIONS

VCC

TA = 25°C

MIN

MAX

UNIT

PARAMETER

TEST CONDITIONS

VCC

MIN

TYP

MAX

MIN

MAX

UNIT

3 V

2.9

2.9

IOH = –50 µA

4.5 V

4.4

4.4

5.5 V

5.4

5.4

VOH

IOH = –4 mA

3 V

2.58

2.48

V

I24

A

4.5 V

3.94

3.8

IOL = –24 mA

5.5 V

4.94

4.8

IOH = –75 mA†

5.5 V

3.85

3 V

0.1

0.1

IOL = 50 µA

4.5 V

0.1

0.1

5.5 V

0.1

0.1

VOL

IOL = 12 mA

3 V

0.36

0.44

V

IOL =24mA

4.5 V

0.36

0.44

IOL = 24 mA

5.5 V

0.36

0.44

IOL = 75 mA†

5.5 V

1.65

II

VI = VCC or GND

5.5 V

±0.1

±1

µA

IOZ

VO = VCC or GND

5.5 V

±0.5

±5

µA

ICC

VI = VCC or GND,

IO = 0

5.5 V

8

80

µA

Ci

VI = VCC or GND

5 V

4

pF

Co

VO = VCC or GND

5 V

10

pF

† Not more than one output should be tested at a time, and the duration of the test should not exceed 10 ms.