CY74FCT16240T

CY74FCT162240T

2

(Above which the useful life may be impaired. For user

guidelines, not tested.)

Storage Temperature ......................Com’l . –55

°C to +125°C

Ambient Temperature with

Power Applied..................................Com’l . –55

°C to +125°C

DC Input Voltage ........................................... –0.5V to +7.0V

DC Output Voltage......................................... –0.5V to +7.0V

DC Output Current

(Maximum Sink Current/Pin) ........................–60 to +120 mA

Power Dissipation .......................................................... 1.0W

Static Discharge Voltage

(per MIL-STD-883, Method 3015) .............................>2001V

Pin Summary

Name

Description

OE

Three-State Output Enable Inputs (Active LOW)

A

Data Inputs

Y

Three-State Outputs

Inputs

Outputs

OE

A

Y

L

L

H

L

H

L

H

X

Z

Operating Range

Range

Ambient Temperature

Industrial

–40

°C to +85°C

5V

± 10%

Parameter

Description

Test Conditions

Min.

Max.

Unit

Input HIGH Voltage

2.0

V

Input LOW Voltage

0.8

V

100

mV

Input Clamp Diode Voltage

–0.7

–1.2

V

Input HIGH Current

±1

µA

Input HIGH Current

±1

µA

Input LOW Current

±1

µA

Input LOW Current

±1

µA

High Impedance Output Current

(Three-State Output pins)

±1

µA

High Impedance Output Current

(Three-State Output pins)

±1

µA

–80

–140

–200

mA

–50

–180

mA

Power-Off Disable

[7]

±1

µA

Output Drive Characteristics for CY74FCT16240T

Parameter

Description

Test Conditions

Min.

Max.

Unit

Output HIGH Voltage

2.5

3.5

V

2.4

3.5

V

2.0

3.0

V

Output LOW Voltage

0.2

0.55

V

Notes:

1.

H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care. Z = High Impedance.

2.

Operation beyond the limits set forth may impair the useful life of the device. Unless noted, these limits are over the operating free-air temperature range.

3.

4.

5.

This parameter is specified but not tested.

6.

Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample

and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting

of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter

7.

Tested at +25˚C.