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LM185BYH1.2-SMD 데이터시트(HTML) 3 Page - Texas Instruments

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부품명 LM185BYH1.2-SMD
상세내용  Micropower Voltage Reference Diode
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제조사  TI1 [Texas Instruments]
홈페이지  http://www.ti.com
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LM185BYH1.2-SMD 데이터시트(HTML) 3 Page - Texas Instruments

 
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LM185-1.2QML
www.ti.com
SNVS384B – OCTOBER 2005 – REVISED JANUARY 2014
Absolute Maximum Ratings
(1)
Reverse Current
30mA
Forward Current
10mA
Operating Temperature Range
−55°C ≤ TA ≤ +125°C
Maximum Junction Temperature (TJmax)
(2)
+150°C
Storage Temperature
−55°C ≤ TA ≤ +150°C
Lead Temperature (Soldering 10
CLGA
260°C
Seconds)
TO package
300°C
20LD LCCC package
300°C
Thermal Resistance
θJA
TO (Still Air)
300°C/W
TO (500LF / Min Air Flow)
139°C/W
20LD LCCC (Still Air)
100°C/W
20LD LCCC (500LF / Min Air
73°C/W
Flow)
CLGA (Still Air)
194°C/W
CLGA (500LF / Min Air Flow)
128°C/W
θJC
TO
57°C/W
20LD LCCC
25°C/W
CLGA
23°C/W
Package Weight (Typical)
TO
TBD
20LD LCCC
TBD
CLGA
210mg
ESD Tolerance(3)
4KV
(1)
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional. For specifications and test conditions, see the Electrical Characteristics. The specifications apply only for
the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test
conditions.
(2)
The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature),
θJA (package junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any
temperature is PDmax = (TJmax - TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is lower.
(3)
Human body model, 1.5K
Ω in series with 100pF.
Quality Conformance Inspection
Table 1. Mil-Std-883, Method 5005 - Group A
Subgroup
Description
Temp °C
1
Static tests at
25
2
Static tests at
125
3
Static tests at
-55
4
Dynamic tests at
25
5
Dynamic tests at
125
6
Dynamic tests at
-55
7
Functional tests at
25
8A
Functional tests at
125
8B
Functional tests at
-55
9
Switching tests at
25
10
Switching tests at
125
11
Switching tests at
-55
12
Settling time at
25
13
Settling time at
125
14
Settling time at
-55
Copyright © 2005–2014, Texas Instruments Incorporated
Submit Documentation Feedback
3
Product Folder Links: LM185-1.2QML


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