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SN74ALS805AN3 데이터시트(PDF) 1 Page - Texas Instruments |
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SN74ALS805AN3 데이터시트(HTML) 1 Page - Texas Instruments |
1 / 15 page SN54ALS805A, SN54AS805B, SN74ALS805A, SN74AS805B HEX 2INPUT NOR DRIVERS SDAS023C − DECEMBER 1982 − REVISED JANUARY 1995 Copyright 1995, Texas Instruments Incorporated 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251−1443 • High Capacitive-Drive Capability • ′ALS805A Has Typical Delay Time of 4.2 ns (CL = 50 pF) and Typical Power Dissipation of 4.2 mW Per Gate • ′AS805B Has Typical Delay Time of 2.6 ns (CL = 50 pF) and Typical Power Dissipation of 12 mW Per Gate • Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic (N) and Ceramic (J) 300-mil DIPs description These devices contain six independent 2-input NOR drivers. They perform the Boolean functions Y = A + B or Y = A • B in positive logic. The SN54ALS805A and SN54AS805B are characterized for operation over the full military temperature range of − 55 °C to 125°C. The SN74ALS805A and SN74AS805B are characterized for operation from 0 °C to 70°C. FUNCTION TABLE (each driver) INPUTS OUTPUT A B OUTPUT Y H X L X HL L L H logic symbol† logic diagram (positive logic) 1 1A 2 1B 4 2A 5 2B 7 3A 8 3B 12 4A 13 4B 1Y 3 2Y 6 3Y 9 4Y 11 15 5A 16 5B 18 6A 19 6B 5Y 14 6Y 17 1Y 3 2Y 6 3Y 9 4Y 11 5Y 14 6Y 17 ≥1 1 1A 2 1B 4 2A 5 2B 7 3A 8 3B 12 4A 13 4B 15 5A 16 5B 18 6A 19 6B † This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. 1 2 3 4 5 6 7 8 9 10 20 19 18 17 16 15 14 13 12 11 1A 1B 1Y 2A 2B 2Y 3A 3B 3Y GND VCC 6B 6A 6Y 5B 5A 5Y 4B 4A 4Y SN54ALS805A, SN54AS805B...J PACKAGE SN74ALS805A, SN74AS805B...DW OR N PACKAGE (TOP VIEW) 3 2 1 20 19 910 11 12 13 4 5 6 7 8 18 17 16 15 14 6A 6Y 5B 5A 5Y 2A 2B 2Y 3A 3B SN54ALS805A, SN54AS805B...FK PACKAGE (TOP VIEW) PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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