TLC2551, TLC2552, TLC2555

5-V, LOW-POWER, 12-BIT, 175/360 KSPS,

SERIAL ANALOG-TO-DIGITAL CONVERTERS WITH AUTOPOWER DOWN

SLAS276D – MARCH 2000 – REVISED MAY 2003

8

POST OFFICE BOX 655303

0.5

µS

2 mS

3.5 mA

8

µA

1

µA

ICC

VDD = 5 V

With 1-

µF/0.1-µF Capacitor Between Supply and Ground

t(Powerdown) – Powerdown time – S

Table 1. Modes of Operation and Data Throughput

CONTROL PIN(s)/DEVICE

MAX SCLK (MHz)

(50/50 duty cycle)

VDD = 4.5 V

APPROXIMATE CONVERSION

THROUGHPUT (ksps)

VDD = 4.5 V

CS control only (TLC2551 only)

For SPI†

15

333

DSP interface‡

8

175

CS and FS control (TLC2551 only)§

DSP interface

20

400

† See Figure 21(a).

‡ See Figure 21(b).

§ See Figure 21(c).

–0.3 V to 6.5 V

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Analog input voltage range

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Reference input voltage

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Digital input voltage range

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

– 40

°C to 150°C

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

0

°C to 70°C

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

I

–40

°C to 85°C

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

– 65

°C to 150°C

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds

260

°C

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

¶ Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and

functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not

implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.