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LF298M 데이터시트(PDF) 11 Page - National Semiconductor (TI)

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부품명 LF298M
상세설명  Monolithic Sample-and-Hold Circuits
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제조업체  NSC [National Semiconductor (TI)]
홈페이지  http://www.national.com
Logo NSC - National Semiconductor (TI)

LF298M 데이터시트(HTML) 11 Page - National Semiconductor (TI)

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Typical Applications (Continued)
Definition of Terms
Hold Step: The voltage step at the output of the sample and
hold when switching from sample mode to hold mode with a
steady (dc) analog input voltage. Logic swing is 5V.
Acquisition Time: The time required to acquire a new ana-
log input voltage with an output step of 10V. Note that acqui-
sition time is not just the time required for the output to settle,
but also includes the time required for all internal nodes to
settle so that the output assumes the proper value when
switched to the hold mode.
Gain Error: The ratio of output voltage swing to input volt-
age swing in the sample mode expressed as a per cent dif-
ference.
Hold Settling Time: The time required for the output to
settle within 1 mV of final value after the “hold” logic com-
mand.
Dynamic Sampling Error: The error introduced into the
held output due to a changing analog input at the time the
hold command is given. Error is expressed in mV with a
given hold capacitor value and input slew rate. Note that this
error term occurs even for long sample times.
Aperture Time: The delay required between “Hold” com-
mand and an input analog transition, so that the transition
does not affect the held output.
Connection Diagrams
Differential Hold
DS005692-57
Capacitor Hysteresis Compensation
DS005692-56
**Adjust for amplitude
Dual-In-Line Package
DS005692-11
Order Number LF398N
or LF398AN
See NS Package Number N08E
Small-Outline Package
DS005692-15
Order Number LF298M or LF398M
See NS Package Number M14A
Metal Can Package
DS005692-14
Order Number LF198H,
LF198H/883, LF298H,
LF398H, LF198AH or LF398AH
See NS Package Number H08C
(Note 8)
www.national.com
11


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