전자부품 데이터시트 검색엔진 |
|
TLE4963-1M 데이터시트(PDF) 7 Page - Infineon Technologies AG |
|
TLE4963-1M 데이터시트(HTML) 7 Page - Infineon Technologies AG |
7 / 17 page Data Sheet 7 Revision 1.0 2016-01-12 TLE4963-1M Functional Description 2.4 Block Diagram Figure 3 Functional Block Diagram TLE4963-1M 2.5 Functional Block Description The chopped Hall IC switch comprises a Hall probe, bias generator, compensation circuits, oscillator and output transistor. The bias generator provides currents for the Hall probe and the active circuits. Compensation circuits stabilize the temperature behavior and reduce influence of technology variations. The active error compensation (chopping technique) rejects offsets in the signal path and the influence of mechanical stress to the Hall probe caused by molding and soldering processes and other thermal stress in the package. The chopped measurement principle together with the threshold generator and the comparator ensures highly accurate and temperature stable magnetic thresholds. Voltage Regulator Bias and Compensation Circuits Oscillator and Sequencer To All Subcircuits Spinning Hall Probe Amplifier Low Pass Filter Comparator with Hysteresis Driver GND Q VDD Reference |
유사한 부품 번호 - TLE4963-1M_16 |
|
유사한 설명 - TLE4963-1M_16 |
|
|
링크 URL |
개인정보취급방침 |
ALLDATASHEET.CO.KR |
ALLDATASHEET 가 귀하에 도움이 되셨나요? [ DONATE ] |
Alldatasheet는? | 광고문의 | 운영자에게 연락하기 | 개인정보취급방침 | 링크교환 | 제조사별 검색 All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |