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AM29LV065DU121REEN 데이터시트(PDF) 11 Page - Advanced Micro Devices |
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AM29LV065DU121REEN 데이터시트(HTML) 11 Page - Advanced Micro Devices |
11 / 52 page 10 Am29LV065D January 10, 2002 enabled for read access until the command register contents are altered. See “VersatileIO TM (V IO) Control” for more information. Refer to the AC Read-Only Operations table for timing specifications and to Figure 13 for the timing diagram. I CC1 in the DC Characteristics table represents the ac- tive current specification for reading array data. Writing Commands/Command Sequences To write a command or command sequence (which in- cludes programming data to the device and erasing sectors of memory), the system must drive WE# and CE# to V IL, and OE# to VIH. The device features an Unlock Bypass mode to facil- itate faster programming. Once the device enters the Unlock Bypass mode, only two write cycles are re- quired to program a byte, instead of four. The “Byte Program Command Sequence” section has details on programming data to the device using both standard and Unlock Bypass command sequences. An erase operation can erase one sector, multiple sec- tors, or the entire device. Table 2 indicates the address space that each sector occupies. I CC2 in the DC Characteristics table represents the ac- tive current specification for the write mode. The AC Characteristics section contains timing specification tables and timing diagrams for write operations. Accelerated Program Operation The device offers accelerated program operations through the ACC function. This function is primarily in- tended to allow faster manufacturing throughput dur- ing system production. If the system asserts V HH on this pin, the device auto- matically enters the aforementioned Unlock Bypass mode, temporarily unprotects any protected sectors, and uses the higher voltage on the pin to reduce the time required for program operations. The system would use a two-cycle program command sequence as required by the Unlock Bypass mode. Removing V HH from the ACC pin returns the device to normal op- eration. Note that the ACC pin must not be at V HH for operations other than accelerated programming, or device damage may result. Autoselect Functions If the system writes the autoselect command se- quence, the device enters the autoselect mode. The system can then read autoselect codes from the inter- nal register (which is separate from the memory array) on DQ7–DQ0. Standard read cycle timings apply in this mode. Refer to the Autoselect Mode and Autose- lect Command Sequence sections for more informa- tion. Standby Mode When the system is not reading or writing to the de- vice, it can place the device in the standby mode. In this mode, current consumption is greatly reduced, and the outputs are placed in the high impedance state, independent of the OE# input. The device enters the CMOS standby mode when the CE# and RESET# pins are both held at V CC ± 0.3 V. (Note that this is a more restricted voltage range than V IH.) If CE# and RESET# are held at VIH, but not within V CC ± 0.3 V, the device will be in the standby mode, but the standby current will be greater. The device re- quires standard access time (t CE) for read access when the device is in either of these standby modes, before it is ready to read data. If the device is deselected during erasure or program- ming, the device draws act ive current until t he operation is completed. I CC3 in the DC Characteristics table represents the standby current specification. Automatic Sleep Mode The automatic sleep mode minimizes Flash device en- ergy consumption. The device automatically enables this mode when addresses remain stable for t ACC + 30 ns. The automatic sleep mode is independent of the CE#, WE#, and OE# control signals. Standard ad- dress access timings provide new data when ad- dresses are changed. While in sleep mode, output data is latched and always available to the system. I CC4 in the DC Characteristics table represents the automatic sleep mode current specification. RESET#: Hardware Reset Pin The RESET# pin provides a hardware method of re- setting the device to reading array data. When the RE- SET# pin is driven low for at least a period of t RP, the device immediately terminates any operation in progress, tristates all output pins, and ignores all read/write commands for the duration of the RESET# pulse. The device also resets the internal state ma- chine to reading array data. The operation that was in- terrupted should be reinitiated once the device is ready to accept another command sequence, to en- sure data integrity. Current is reduced for the duration of the RESET# pulse. When RESET# is held at V SS±0.3 V, the device draws CMOS standby current (I CC4). If RESET# is held at V IL but not within VSS±0.3 V, the standby current will be greater. The RESET# pin may be tied to the system reset cir- cuitry. A system reset would thus also reset the Flash memory, enabling the system to read the boot-up firm- ware from the Flash memory. |
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