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SMP100LC-200 데이터시트(PDF) 6 Page - STMicroelectronics |
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SMP100LC-200 데이터시트(HTML) 6 Page - STMicroelectronics |
6 / 8 page SMP100LC-xxx 6/8 TEST PROCEDURE : Pulse test duration (tp = 20ms): - For Bidirectional devices = Switch K is closed - For Unidirectional devices = Switch K is open. VOUT Selection - Device with VBO < 200 Volt -VOUT = 250 VRMS,R1 = 140 Ω. - Device with VBO ≥ 200 Volt -VOUT = 480 VRMS,R2 = 240 Ω. TEST CIRCUIT 2 FOR IBO and VBO parameters : 220V 50Hz 1/4 R1 = 140 Ω R2 = 240 Ω K ton = 20ms IBO measurement VBO measurement Vout DUT TEST CIRCUIT 3 FOR IH PARAMETER R V BAT = - 48 V Surge generator D.U.T This is a GO-NO GO test which allows to confirm the holding current (IH) level in a functional test circuit. TEST PROCEDURE : - Adjust the current level at the IH value by short circuiting the D.U.T. - Fire the D.U.T. with a surge current : Ipp = 10A, 10/1000 µs. - The D.U.T. will come back to the off-state within 50 ms max. |
유사한 부품 번호 - SMP100LC-200 |
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유사한 설명 - SMP100LC-200 |
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